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Measurement of the Ec.m.=184keV Resonance Strength in the Al26g(p,gamma)Si27 Reaction
Measurement of the Ec.m.=184keV Resonance Strength in the Al26g(p,gamma)Si27 Reaction
2006
C. G. Tavera Ruiz
A. Parikh
Jordi Jose
L. Buchmann
Joseph A. Caggiano
Alan Anlon Chen
J. A. Clark
H. Crawford
Barry Samuel Davids
John M. DAuria
C.A. Davis
C. Deibel
Luke E. Erikson
L. Fogarty
D. Frekers
Uwe Greife
A. Hussein
Dave Hutcheon
Mark Huyse
C. C. Jewett
A. M. Laird
Rachel Lewis
P. Mumby-Croft
Art Olin
D. Ottewell
C. V. Ouellet
P. D. Parker
John E. Pearson
G. Ruprecht
M. Trinczek
C. Vockenhuber
C. Wrede
Keywords:
White dwarf
Resonance
Physics
Nuclear magnetic resonance
Correction
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