Rasterlumineszenzlichtmikroskop with grilles Lumineszenzverhinderungslicht and additional light

A Rasterlumineszenzlichtmikroskop (43) for high spatial resolution imaging of a one luminescent marker carrying structure of a sample (15) has a Lumineszenzverhinderungslicht (38) and that differs from the luminescent light further light-providing light source (46), a Lichtformungs- and aligning device and a detector (56 ) on. The Lichtformungs- and aligning device formed of two non-coherent beams (19, 20) of the Lumineszenzverhinderungslichts (38) by means of optical gratings (21, 22) has four pairs coherent partial beams and focuses them with a common lens (25) so that it is in the range the sample (15) form two intersecting line grating. The intersecting line gratings each have a plurality of one-dimensionally limited local intensity minima, so that an intensity distribution of Lumineszenzverhinderungslichts (38) in the sample comprises a two dimensional array of identical, at least two-dimensionally limited local intensity minima. At least one beam (39, 40) of the further light (17) occurs with one of the two beams (19, 20) of the Lumineszenzverhinderungslichts (38) in the Lichtformungs- and aligning device, so that the aligning device from the Lichtformungs- and beam (39, 40) of the further light (17) by means of one of the optical gratings (21, 22) forms two coherent partial beams of the additional light (17) and the partial beams of the additional light (17) with the lens focused (25) together, so that they form in the area of ​​the sample (15) is a line grid having a plurality of one-dimensionally limited and extending parallel to the local intensity minima of the line gratings of the Lumineszenzverhinderungslichts (38) extending local intensity maxima and intensity minima. Furthermore, the Lichtformungs- and aligning device aligns the line gratings of the additional light (17) as compared to the one of the line gratings of the Lumineszenzverhinderungslichts (38), that the local intensity maxima or local intensity minima of the further light (17) with the intensity minima of the Lumineszenzverhinderungslichts (38 ) coincide. In addition, the Lichtformungs- shifting and aligning device, the intensity distributions of the other light (17) and the Lumineszenzverhinderungslichts (38) facing the sample (15) to scan a region of interest of the sample (15) with the intensity minima the intensity distribution of Lumineszenzverhinderungslichts (38). The detector (56) registers the in the areas of the individual intensity minima of the intensity distribution of the ...