Sensitive characterization of phase and amplitude semiconductor nonlinearities for broadband 20 fs excitation
2000
We present an experimental technique that allows for the detection of pump-induced transmission and phase changes with high sensitivity and ultrafast temporal resolution over an arbitrarily wide time window. This is achieved combining spectral interferometry with high-frequency-chopping differential transmission measurements. With this setup, exciton and continuum nonlinearities in a semiconductor are studied for broadband excitation. We find that the pump-induced phase changes at the exciton and in the continuum decay on distinctly different time scales, indicating different microscopic origins.
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