Quantifying Jahn-Teller distortion at the nanoscale with picometer accuracy using position averaged convergent beam electron diffraction

The Jahn-Teller distortion in LaMnO3 is quantitatively measured with picometer precision using position averaged convergent beam electron diffraction acquired at the unit-cell level in the scanning transmission electron microscope (STEM). This provides a platform for accurate detection of local 3D structural information at defects and interfaces on the atomic scale.