Old Web
English
Sign In
Acemap
>
Paper
>
Strain Measurements in Porous Silicon by Raman Scattering
Strain Measurements in Porous Silicon by Raman Scattering
2008
M. A. Ferrara
L. Sirleto
G. Messina
M. G. Donato
L. Rotiroti
I. Rendina
Keywords:
Porous silicon
Raman spectroscopy
Raman scattering
Ceramic materials
Analytical chemistry
Materials science
Strain (chemistry)
Composite material
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]