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High-Voltage Electron Microscopy Analysis of Misfit Dislocations in GaP 1− x As x Light Emitting Diode
High-Voltage Electron Microscopy Analysis of Misfit Dislocations in GaP 1− x As x Light Emitting Diode
1991
Yutaka Takahashi
Kozo Sakata
Yoichi Ishida
Keywords:
Light-emitting diode
High voltage
Materials science
Dislocation
Optoelectronics
Electron microscope
high voltage electron microscopy
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