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3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam
3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam
2014
Xin Man
Tatsuya Asahata
Atsushi Uemoto
Hidekazu Susuki
Hiroyuki Suzuki
Masakatsu Hasuda
Toshiaki Fujii
Keywords:
Analytical chemistry
Atom probe
Beam (structure)
Scanning capacitance microscopy
Materials science
Sample preparation
Correction
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