A way to reach high accuracy in the determination of the magnetic London penetration depth in superconductors by polarized neutron reflectometry
1996
Abstract We suggest a way to refine the picture of the London penetration depth Λ into superconductors determined by polarized neutron reflectometry. With a thin film of 2000 A, the flipping ratio exhibits numerous contrasted oscillations, which is not the case for bulk samples.
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