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Electrically Active Defects Induced by α‐Particle Irradiation in p‐Type Si Surface Barrier Detector
Electrically Active Defects Induced by α‐Particle Irradiation in p‐Type Si Surface Barrier Detector
2021
Sergey Bakhlanov
N. V. Bazlov
Ilia Chernobrovkin
Denis V. Danilov
Alexander Derbin
Ilia Drachnev
Irina Kotina
Oleg Konkov
Artem Kuzmichev
Maksim Mikulich
Valentina Muratova
Maxim Trushin
Evgeniy Unzhakov
Keywords:
Irradiation
Detector
α particles
Analytical chemistry
Materials science
surface barrier
Correction
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