Local measurement of conduction band offset for ZnCdS/ZnSSe nano‐structure by Laplace current DLTS cooperated with AFM technique

ZnCdS/ZnSSe SQW structure were investigated by current deep level transient spectroscopy (DLTS) with Laplace transform cooperated with atomic force microscopy (AFM) for the first time. Cathodoluminescence (CL) measurements were carried out also. Basing on Laplace current DLTS with AFM and CL data we estimated the conduction band offset of the ZnCdS/ZnSSe interface in the different regions of the structure. Size of the investigated region was commensurable with the diameter of cantilever tip. We demonstrated that Laplace current DLTS-spectrometer switched in the circuit of an AFM cantilever may be used for an investigation of nanostructures. (© 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)