Domain inversion with 0.8µm period by Using a conductive AFM tip and its application to QPM-SHG devices

In this paper, we demonstrate a newly developed domain inversion technique using the improved AFM which is possible to scan a wide area through a conductive AFM tip, and also a thin LiNbO 3 substrate called “a terrace substrate” using a dicing saw. Fine domain inversion period with less than 0.8µm is obtained. A novel SHG blue laser is also demonstrated using the terrace substrate and the extended AFM domain inversion technique. C 2010 Optical Society of America