Old Web
English
Sign In
Acemap
>
Paper
>
High resolution electron microscopy and atomic force microscopy of grain boundary and surface of minerals
High resolution electron microscopy and atomic force microscopy of grain boundary and surface of minerals
1995
uehara seiitirou
Uehara Seiichiro
Keywords:
Conductive atomic force microscopy
Illite
High-resolution transmission electron microscopy
Scanning capacitance microscopy
Kelvin probe force microscope
Atomic force microscopy
Grain boundary
Electron microscope
Geology
Mineralogy
Composite material
high resolution electron microscopy
Correction
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]