Characterization of dynamic random process using optical vortex metrology

We propose an innovative approach based on optical vortex metrology (OVM) to characterize a dynamic random process. The dynamic process under consideration involves scatterers within a sample moving stochastically with time evolution. Specifically, the dynamic random process such as white paint drying has been investigated experimentally. In simulations, two unique descriptors, namely the successive survival rate of optical vortices and the average velocity of survival vortices, are introduced to determine the dynamic process based on the uniqueness of the optical vortex. Numerical simulation and experimental results show that these unique descriptors can be used to quantitatively analyze the dynamic process. Furthermore, we have found that further information on the dynamic process can be obtained by the proposed method, thereby facilitating innovative applications using OVM.