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Characterization of polymeric surfaces and interfaces using time‐of‐flight secondary ion mass spectrometry
Characterization of polymeric surfaces and interfaces using time‐of‐flight secondary ion mass spectrometry
2021
Hao Mei
Travis S. Laws
Tanguy Terlier
Rafael Verduzco
Gila E. Stein
Keywords:
Analytical chemistry
Secondary ion mass spectrometry
characterization
Materials science
spectral analysis
Time of flight
Correction
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