Laser Actuated Non-Invasive Smart Instrumentation - Enabling Lab-on-Chip

Non-invasive optical instrumentation provides non-destructive, reliable, and precise control in industrial process regulation, especially when chemical compounds or organic material surfaces are always a point of care. Nanomaterial dynamics intrinsically exhibit higher order of visual scanning complexities, associate wholly or partially to the poor scanning instrumentations. Additionally, growing trends in analytical instrumentation towards smart Lab-On-a-Chip (IoT sensing nodes) have shifted the emphasis on sensitivity and robustness tailoring Product Specific Environment (PSE). This work presents a hybrid laser actuated scanning mechanism, rastered back and forth 3-D imaging technique enabling Microscopy to its widest application in biological and material sciences and hence rose challenge of predicting large missing or incorrect data obtained during experiments. Our Confocal Self Calibrated Interferometry based fabricated Laser Sensor demonstrates its efficacy in non-invasive scanning microscopy to achieve a high-resolution 3D topographical view, eventually an add-on to the analytical model of microorganisms and nanomaterial. In contrast to linear controllers, PI controllers demonstrate better stability in controlling the laser leakage at tip, which consists of two channel tube adjustments and successively in laser reflector lens, Photo Multiplier Tube (PMT), and Data Acquisition Unit (DAU). We expose our results for error propagation across various grid patterns over a 1mm2 section, plotting the intensity of a key band or bands over the PMT grid. We observe that the instrumentation errors can be nullified by modeling the ergodicity of information flow along with the SLM instrumentation.