Effect of different p-dopants in an interconnection unit on the performance of tandem organic solar cells

Abstract We report the effect of different p -dopants (ReO 3 , MoO 3 and CuI) used in the interconnection unit (ICU) composed of electron-transporting layer (ETL)/metal/ p -doped hole-transporting layer ( p -HTL) on the performance of tandem organic photovoltaic (TOPV) cells. Dopants with higher charge generation efficiency resulted in higher open circuit voltage ( V OC ) due to the reduction of the difference between the Fermi level and the HOMO level of the p -HTL, and higher fill factor ( FF ) due to the efficient hole transport at the interface between Ag and p -HTL through the tunneling process.