Phase retrieval low energy electron microscopy
2010
We consider the utility of phase-retrieval methods in low energy electron microscopy (LEEM). Computer simulations are presented, demonstrating recovery of the terraced height profile of atomic steps. This recovery uses phase retrieval to decode a single LEEM image, incorporating the effects of defocus, spherical aberration and chromatic aberration. The ability of the method, to obtain temporal sequences of evolving step profiles from a single LEEM movie, is discussed.
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