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Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures.
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures.
2022
Seung Yup Jang
Zeyu Chen
Dongyoung Kim
Justin Lynch
Yafei Liu
Balaji Raghothamachar
Minseok Kang
Anant Agarwal
Robert Stahlbush
Michael Dudley
Woongje Sung
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