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Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors.
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors.
2022
Alexander Makarov
Adrian Chasin
Erik Bury
Markus Jech
Michiel Vandemaele
Alexander Grill
An De Keersgieter
Mikhail I. Vexler
Geert Eneman
Ben Kaczer
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