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Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability.
Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability.
2022
K Watanabe
T. Shimada
K Hirose
H. Shindo
D. Kobayashi
Takaho Tanigawa
Shoji Ikeda
Takamitsu Shinada
Hiroki Koike
Tetsuo Endoh
T. Makino
Takeshi Ohshima
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