Characterization of Small Cu Grains Using the Conical Dark-Field Technique in the Transmission Electron Microscope
2011
Keywords:
- Analytical chemistry
- Scanning transmission electron microscopy
- Conventional transmission electron microscope
- Energy filtered transmission electron microscopy
- Low-voltage electron microscope
- Electron tomography
- Electron beam-induced deposition
- Environmental scanning electron microscope
- Electron microscope
- Materials science
- Dark field microscopy
- Optics
- Correction
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