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Preparation and microstructure analysis of Mo/Si multilayers as x-ray optical components
Preparation and microstructure analysis of Mo/Si multilayers as x-ray optical components
1993
A. Kloidt
H.J. Stock
Ulf Kleineberg
T. Döhring
M. Pröpper
Steffen Rahn
K. Hilgers
B. Heidemann
T. Tappe
B. Schmiedeskamp
Ulrich Heinzmann
Keywords:
Crystallography
Microstructure
X-ray
Materials science
Analytical chemistry
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