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Hot Electron Attenuation Length Measurements of Cu and Ag using BEEM
Hot Electron Attenuation Length Measurements of Cu and Ag using BEEM
2010
J. J. Garramone
Joseph Abel
Ilona Sitnitsky
Lai Zhao
Ian Appelbaum
V. P. LaBella
Keywords:
Attenuation length
Schottky barrier
Electron scattering
Analytical chemistry
Metal–semiconductor junction
Ballistic electron emission microscopy
Schottky diode
Optics
Materials science
Integrated circuit
Electron
Optoelectronics
hot electron
Correction
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