Simultaneous Observation of Millisecond Dynamics in Atomistic Structure, Force and Conductance on the Basis of Transmission Electron Microscopy
2001
High-resolution transmission electron microscopy (HRTEM) has been developed to possess functions of atomic force microscopy and scanning tunneling microscopy. Dynamics of subnano Newton-scale force and conductance were simultaneously observed at intervals of 1/30–1/3840 s during HRTEM imaging of contact, deformation and fracture processes between nanometer-sized tips. The experimental basis of the atomic-scale mechanics of materials was developed on the basis of the present microscopy.
Keywords:
- Scanning confocal electron microscopy
- Conductive atomic force microscopy
- Scanning ion-conductance microscopy
- High-resolution transmission electron microscopy
- Spin polarized scanning tunneling microscopy
- Energy filtered transmission electron microscopy
- Analytical chemistry
- Scanning capacitance microscopy
- Physics
- Kelvin probe force microscope
- Microscopy
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
4
References
73
Citations
NaN
KQI