Young's elastic modulus tester with vernier depth gauge

The invention relates to a Young's elastic modulus tester with a vernier depth gauge. In the existing Young's elastic modulus instrument for measuring a steel wire by a pulling method, an original optical lever system is cancelled, and the steel wire and a main scale of the vernier depth gauge are fixed together by a dual-purpose movable clamping head. An auxiliary scale of the vernier depth gauge is fixed on a workbench, the upper end of the steel wire is fixed on an upper beam of a frame of the Young's elastic modulus tester, while the lower end is connected with a hook tray, wherein weights can be increased and reduced on the hook tray so as to change pulling force. A testing person increases and reduces the weights to change the pulling force, and the steel wire is stretched along with the changed pulling force; readings on the vernier depth gauge are changed, and a difference value of the readings is the stretching quantity of the steel wire, thus a small variable quantity of the steel wire length being difficult to measure in a process of measuring a Young's elastic modulus by a stretching method is accurately measured through the vernier depth gauge. Other physical quantities required by calculating the Young's elastic modulus can be measured according to a conventional method.