Synchrotron-based X-ray Tomographic Microscopy at the Swiss Light Source for Industrial Applications

The potential of X-rays for the non-invasive investigation of the interior of bulky samples has long been recognized and their penetration depth is presently widely exploited [1]. Although initially third generation synchrotron sources were almost exclusively the realm of academic scientific experiments, the use of synchrotron light for industrial research is becoming increasingly important and relevant for both technology development and non-destructive testing, in particular when the requirements in terms of spatial, temporal, and density resolution are exceptional.