Wideband Complex Permittivity Tester for 5G Materials

Material characterization for 5G radio use is vital, because much lighter imperfections than previously can affect radio performance. One of the material types to be characterized are dielectrics. In this paper we propose a way to use absorbers to suppress unwanted test system resonances for circular disk test method of dielectrics. The findings are based on measurements and simulations. Absorbers enable that the method can be applied from telecommunications bands around 2GHz up to 50GHz and with more than twenty resonance modes while in other sources this is typically limited to only around three to five. The advantage is wideband single sweep measurement of especially the loss tangent. This method can be also expanded to higher frequencies with slight modifications.