Comparison of Ti/Au and Mo/Au TESs characterized under DC bias

Carlos Pobes,Lourdes Fabrega,Agustín Camón,Pavel Strichovanec,Javier Moral-Vico,Nieves Casañ Pastor,Rosa M. Jáudenes,Javier Sesé Monclús,Pourya Khosropanah,E. Taralli,K Nagayoshi

Comparison of Ti/Au and Mo/Au TESs characterized under DC bias

2018

Carlos Pobes
Lourdes Fabrega
Agustín Camón
Pavel Strichovanec
Javier Moral-Vico
Nieves Casañ Pastor
Rosa M. Jáudenes
Javier Sesé Monclús
Pourya Khosropanah
E. Taralli
K Nagayoshi

Resumen del trabajo presentado al 13th Workshop on Low Temperature Electronics (WOLTE-13), celebrado en Sorrento (Italia) del 10 al 13 de septiembre de 2018.

Keywords:

Optoelectronics
DC bias
Materials science

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