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2次世代技術ノードのためのIII‐V超薄型,FinFET,およびナノワイヤMOSFETの性能予測【Powered by NICT】
2次世代技術ノードのためのIII‐V超薄型,FinFET,およびナノワイヤMOSFETの性能予測【Powered by NICT】
2016
Martin Rau
Enrico Caruso
Daniel Lizzit
Pierpaolo Palestri
David Esseni
Andreas Schenk
L. Selmi
Mathieu Luisier
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