Low current application dedicated process characterization method

We present in this paper a new characterization method dedicated to an analog low consumption application design. A test structure, based on a bandgap reference voltage, that allows parameters extraction at the circuit operating point, is presented. This test structure is used to adjust the final SPICE parameters in order to calibrate the electrical measurement value of each component of the circuit on the chip. An improvement of the design is simulated, tested and validated on silicon.