A new technique of characterization of intrapixel response dedicated to astronomical detectors

Abstract This paper is devoted to the presentation of a new technique of characterization of the intra-pixel sensitivity variations (IPSVs) of astronomical detectors. The IPSV is the spatial variation of the pixel response function (PRF). In the case of under-sampled instruments for high quality imaging and accurate photometry, IPSV can contribute to the instrument global error and it should be considered carefully. Our measurement technique is based in the Fourier transform (FT) approach. It consists into the sampling of the pixel transfer function (PTF) by projecting high-resolution periodic patterns onto the whole sensor without classic optics but using the self-imaging property (the Talbot effect) of a continuously self imaging grating (CSIG) illuminated by a plane wave. The PRF is determined by computing the inverse FT. Our measurement technique permits to determine the PRF with a resolution of pixel/10 (10 times Nyquist frequency).