Tailoring the emission wavelength and s-p splitting in MOCVD-grown InGaAs/GaAs quantum dots emitting above 1.3 {\mu}m

The electronic structure of strain-engineered In$_{0.75}$Ga$_{0.25}$As/GaAs quantum dots emitting in the telecommunication O band is probed experimentally by photoluminescence excitation spectroscopy on the single-dot level. The observed resonances are attributed to p-shell states of individual quantum dots. The determined energy difference between s- and p-shells shows an inverse dependence on the emission energy. This observation is attributed to the varying indium content within individual quantum dots, indicating a way to control the quantum dot electronic structure. The impact of the size and indium content in the investigated quantum dots is simulated with an 8-band $\mathbf{k}\cdot\mathbf{p}$ model supporting the interpretation of the experimental data.