Mueller Matrix for Chromium Nanofilms on a Glass Substrate

The Mueller matrix elements for the set of chromium nanofilms are calculated based on the ellipsometry of the incident and reflected light beams at the four initial polarization states. The investigated chromium nanofilms presumably were 132 nm, 151 nm and 183 nm thick. Normalized elements of the Mueller matrix as the functions of the angle of incidence at the nanofilm are depicted in the corresponding graphs. The light beam was generated by a HeNe laser at about 633 nm wavelength. A significant dependence on the thickness of the nanofilms was not observed for the matrix elements M12, M43, M21, M31, M24, M34, M33, M44. The provided data is applicable for the investigation of the complex refractive index of the given Cr thin films.