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Single event effect in power MOSFETs and CMOS ICs by high-energy heavy ion
Single event effect in power MOSFETs and CMOS ICs by high-energy heavy ion
1994
Sumio Matsuda
Satoshi Kuboyama
Yosuke Shimano
Masato Uesugi
Toru Kanno
Tsuyoshi Kono
Takahide Nakagawa
Masayuki Kase
Akira Goto
Yasushige Yano
matuda sumio
kuboyama satosi
daoyeyangjie
uesugi masahito
kanno tooru
kouno tuyosi
nakagawa takasi syuu
kase masayuki
gotou akira
yano anjuu
Keywords:
Ion track
single event burnout
Power MOSFET
heavy ion
single event effect
high energy
CMOS
MOSFET
Materials science
Optoelectronics
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