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Spin-Analyzed SANS for Soft Matter Applications | NIST
Spin-Analyzed SANS for Soft Matter Applications | NIST
2017
Wangchun Chen
John G. Barker
Ronald L. Jones
Kathryn L. Krycka
Shannon Watson
Cedric Victor Lucien Gagnon
T. Perevozchivoka
Paul Butler
Thomas R. Gentile
Keywords:
NIST
Inelastic scattering
Nuclear physics
Nuclear magnetic resonance
Spin-½
Soft matter
Physics
Materials science
Correction
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