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Optical and x-ray characterization applied to multilayer reverse engineering
Optical and x-ray characterization applied to multilayer reverse engineering
1998
Thierry Boudet
M. Berger
Oliver Lartigue
B. Hirrien
Keywords:
Optics
Thin film
Physics
X-ray reflectivity
Reverse engineering
X-ray
Band-pass filter
Reflectivity
X-ray optics
Refractive index
Correction
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