On the field dependence of intrinsic and extrinsic time-dependent breakdown

In this study the field acceleration of intrinsic and extrinsic breakdown is studied. For the intrinsic mode an exp(l/E)acceleration law is found, while for the extrinsic mode an new exp(E)-acceleration law for QB D is proposed, This field acceleration model is implemented in a maximum likelihood algorithm together with a new analytical expression for fitting competing Weibull distributions. With this algorithm an extensive tgD -data set measured at different stress conditions can be fitted excellently in one single calculation. From the result, predictions of low-field oxide reliability are made and the screening conditions in order to guarantee a pre-set reliability specification are calculated.