Old Web
English
Sign In
Acemap
>
Paper
>
Plasma-deposited amorphous carbon thin films as calibration standards for ion beam analysis
Plasma-deposited amorphous carbon thin films as calibration standards for ion beam analysis
2019
T. Schwarz-Selinger
Keywords:
Analytical chemistry
Amorphous carbon
Plasma
Calibration
Ion beam analysis
Materials science
Thin film
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]