Study on imaging spectrometer with smile and keystone eliminated

Abstract The formulas of image height in two-dimensional field about Gaussian and tilted imaging system of grating-based imaging spectrometer instrument (GISI) are deduced firstly, and the determined expressions of smile and keystone of GISI are obtained. It is proposed to correct the smile with off-axis lens, and the elimination effect of the smile is studied by means of spatial ray tracing. By controlling the degree of off-axis and the distribution of focal power of the off-axis lens, the long-wave infrared imaging spectrometer with well-eliminated smile and keystone is designed. The maximum of smile and keystone at working wavelengths in all fields of view are less than 8.57 µm and 13.33 µm, respectively.