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A4.1 A Metrological Atomic Force Microscope for Large Range Measurements with Sub-nanometre Resolution
A4.1 A Metrological Atomic Force Microscope for Large Range Measurements with Sub-nanometre Resolution
2021
Y. Wu
E. Wirthmann
U. Klöpzig
T. Hausotte
Keywords:
large range
Optics
Atomic force microscopy
Resolution (electron density)
Metrology
Materials science
Nanometre
Correction
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