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Hyung Jin Park
Hyung Jin Park
Centre national de la recherche scientifique
Electronic engineering
Optoelectronics
Logic gate
Leakage (electronics)
Matrix (mathematics)
2
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10
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0
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Z 2 -FET memory matrix in 28 nm FDSOI technology
2018
EUROSOI-ULIS | Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
Mukta Singh Parihar
Kyung Hwa Lee
Hyung Jin Park
C. Navarro
Joris Lacord
F. Gamiz
Philippe Galy
S. Cristoloveanu
Maryline Bawedin
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Insight into carrier lifetime impact on band-modulation devices
2017
Solid-state Electronics
Mukta Singh Parihar
Kyung Hwa Lee
Hyung Jin Park
Joris Lacord
Sebastien Martinie
Jean-Charles Barbe
Yue Xu
Hassan El Dirani
Yuan Taur
S. Cristoloveanu
Maryline Bawedin
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Citations (9)
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