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Bio Kim
Bio Kim
Samsung
Analytical chemistry
Electronic engineering
Chemistry
Flash memory
Logic gate
5
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122
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Analysis of trap distribution in polysilicon channel transistors using the variable amplitude charge pumping method
2015
Solid-state Electronics
Manh Cuong Nguyen
Yoon Seok Jeon
Duc Tai Tong
Seung Won You
Jae Kyeong Jeong
Bio Kim
Jae Young Ahn
Ki-Hyun Hwang
Rino Choi
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Citations (4)
Investigation of ultra thin polycrystalline silicon channel for vertical NAND flash
2011
IRPS | International Reliability Physics Symposium
Bio Kim
Seung-Hyun Lim
Dong-Woo Kim
Toshiro Nakanishi
Sang-Ryol Yang
Jae Young Ahn
Hanmei Choi
Ki-Hyun Hwang
Yongsun Ko
Chang Jin Kang
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Citations (18)
Characterization of threshold voltage instability after program in charge trap flash memory
2009
IRPS | International Reliability Physics Symposium
Bio Kim
Seung Jae Baik
Sunjung Kim
Joon-Gon Lee
Bon-young Koo
Si-Young Choi
Joo-Tae Moon
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Citations (8)
Photocurrent imaging of p-n junctions in ambipolar carbon nanotube transistors.
2007
Nano Letters
Y. H. Ahn
Adam W. Tsen
Bio Kim
Yung Woo Park
Jiwoong Park
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Citations (92)
Direct I-V measurement of polypyrrole nanotube using conductive scanning probe microscope
2003
Jin Gyu Park
Seung Hyun Lee
Bio Kim
Yung Woo Park
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