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Steven Sherman
Steven Sherman
Varian Semiconductor
Electronic engineering
Electromigration
Materials science
Computer science
Logic gate
4
Papers
8
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0
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Reduction of GIDL Using Dual Work-Function Metal Gate in DRAM
2016
IMW | International Memory Workshop
S. K. Gautam
Satish Maheshwaram
S. K. Manhas
Arvind Kumar
Steven Sherman
Sung-Ho Jo
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Device and process design of leading edge transistors for performance and yield
2016
ICSICT | IEEE International Conference on Solid-State and Integrated Circuit Technology
Hans-Joachim L. Gossmann
Steven Sherman
Morgan D. Evans
Kevin Anglin
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Integration and characterization of gas cluster processing for copper interconnects electromigration improvement
2007
Microelectronic Engineering
R. Gras
L.G. Gosset
E. Petitprez
V. Girault
M. Hopstaken
S. Jullian
G. Imbert
Y. Le Friec
J. Bienacel
J. Guillan
T. Chevolleau
Steven Sherman
Martin D. Tabat
J. Hautala
J. Torres
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Citations (2)
Infusion Processing for Reliable Copper Interconnects
2007
SDM | SIAM International Conference on Data Mining
S. Kondo
T. Ishigami
M Enomoto
T. Suzuki
Steven Sherman
Martin D. Tabat
J. Hautala
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