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Penugonda Harsha Vardhan

Indian Institute of Technology Bombay

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Nanoscale Transistor Variability Modeling : How Simple Physics Enables a Powerful Prediction Platform

2020 IEEE Nanotechnology Magazine
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Statistical Simulation Study of Metal Grain-Orientation-Induced MS and MIS Contact Resistivity Variability for 7-nm FinFETs

2018 IEEE Transactions on Electron Devices
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