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H. Beckrich
H. Beckrich
STMicroelectronics
Electronic engineering
Silicon on insulator
CMOS
Electrical engineering
Metal gate
2
Papers
41
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First demonstration of a full 28nm high-k/metal gate circuit transfer from Bulk to UTBB FDSOI technology through hybrid integration
2013
VLSIC | Symposium on VLSI Circuits
Dominique Golanski
Pascal Fonteneau
C. Fenouillet-Beranger
A. Cros
F. Monsieur
Nicolas Guitard
Charles-Alexandre Legrand
Alexandre Dray
C. Richier
H. Beckrich
P. Mora
G. Bidal
O. Weber
O. Saxod
Jean-Robert Manouvrier
Philippe Galy
N. Planes
F. Arnaud
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ESD design challenges in 28nm hybrid FDSOI/Bulk advanced CMOS process
2012
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Alexandre Dray
Nicolas Guitard
Pascal Fonteneau
Dominique Golanski
C. Fenouillet-Beranger
H. Beckrich
R. Sithanandam
T. Benoist
Charles-Alexandre Legrand
Ph. Galy
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Citations (12)
1