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Henry W. Trombley
Henry W. Trombley
IBM
Electronic engineering
Threshold voltage
Electronic circuit
Logic gate
Metal gate
2
Papers
7
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0
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SOI FinFET nFET-to-pFET Tracking Variability Compact Modeling and Impact on Latch Timing
2015
IEEE Transactions on Electron Devices
Jie Deng
Ardasheir Rahman
Rainer Thoma
Peter W. Schneider
J. Johnson
Henry W. Trombley
Ning Lu
Richard Q. Williams
Hasan M. Nayfeh
Kai Zhao
Russ Robison
Ximeng Guan
N. Zamdmer
Steve Shuma
Brian A. Worth
James E. Sundquist
Eric A. Foreman
Scott K. Springer
Rick Wachnik
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Citations (7)
Including spatial correlations of channel length and threshold voltage variation in circuit simulations
2012
Microelectronics Reliability
Josef S. Watts
Henry W. Trombley
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