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R. Brüggemann

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48

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388

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Instability effects in hydrogenated microcrystalline silicon thin films

2010 Physica Status Solidi (c)
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Electronic and structural properties of the amorphous/crystalline silicon interface

2009 Thin Solid Films
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Density of states in the gap of microcrystalline silicon determined from thermally-stimulated currents

2008 Thin Solid Films
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Comparison of photoluminescence and capacitance spectroscopies as efficient tools for interface characterisation of heterojunction solar cells

2008 Journal of Non-crystalline Solids
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MOS structures containing silicon nanoparticles for memory device applications

2008
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Thermally-stimulated currents in thin-film semiconduc- tors - computer modelling and experiment

2007 Journal of Optoelectronics and Advanced Materials
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Relation between the dark and photoelectronic properties of microcrystalline silicon

2007 Journal of Optoelectronics and Advanced Materials
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Influence of thermal annealing on the memory effect in MIS structures containing crystalline Si nanoparticles

2007 Journal of Optoelectronics and Advanced Materials
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Luminescence, quasi-Fermi levels and applied voltage in ideal and real semiconductor structures

2007 Journal of Optoelectronics and Advanced Materials
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Thermally-Stimulated Currents in Thin-Film Semiconductors: Analysis and Modelling

2006 MRS Proceedings
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