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BL Yeoh
BL Yeoh
Read-only memory
Fault detection and isolation
Bitmap
Embedded system
Computer science
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Case Studies: Masked read-only memory failure fault isolation without bitmapping
2021
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
BL Yeoh
Mh Thor
Ls Gan
Sh Goh
Yh Chan
WF Soh
C. Shaalini
Wiswa Naradha
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