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Anastasios A. Katsetos
Anastasios A. Katsetos
IBM
Negative-bias temperature instability
Threshold voltage
Optoelectronics
Electronic engineering
Materials science
5
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84
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NBTI model development with regression analysis
2009
Microelectronics Reliability
Anastasios A. Katsetos
Andrew Brendler
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Full Recovery of PFET NBTI and NFET PBTI of high-k metal gate MOSFETs with high temperature bake
2009
Bulletin of the American Physical Society
Anastasios A. Katsetos
James Stathis
F. Guarin
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Negative bias temperature instability (NBTI) recovery with bake
2008
Microelectronics Reliability
Anastasios A. Katsetos
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Citations (30)
Mechanism of Threshold Voltage Shift (ΔVth) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs
2002
Japanese Journal of Applied Physics
Chuan-Hsi Liu
Ming T. Lee
Chih-Yung Lin
Jenkon Chen
Y. T. Loh
Fu-Tai Liou
Klaus Schruefer
Anastasios A. Katsetos
Zhijian Yang
Nivo Rovedo
Terence B. Hook
Clement Hsingjen Wann
Tze-Chiang Chen
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Citations (43)
Mechanism of Threshold Voltage Shift (ΔVth) Caused by Negative Bias Temperature Instability (NBTI) in Deep Sub-Micron pMOSFETs
2001
The Japan Society of Applied Physics
Chuan H. Liu
Ming T. Lee
Chih-Yung Lin
Jenkon Chen
Klaus Schruefer
Thomas Schiml
Anastasios A. Katsetos
Zhijian Yang
Nivo Rovedo
Terence B. Hook
Clement Hsingjen Wann
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Citations (10)
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