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K. Nagahiro
K. Nagahiro
GlobalFoundries
Optoelectronics
Electronic engineering
Logic gate
Degradation (geology)
Acceleration
4
Papers
12
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Optimized LDMOS Offering for Power Management and RF Applications.
2022
IRPS | International Reliability Physics Symposium
J. Singh
J.B. Johnson
W. Zheng
Y Chen
W. Liu
P. Srinivasan
O. Gonzales
M Hauser
M. Koskinen
K. Nagahiro
Y Liu
B. Min
Tanya Nigam
N. Squib
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FinFET with Contact over Active-Gate for 5G Ultra-Wideband Applications
2020
VLSIT | Symposium on VLSI Technology
A. Razavieh
Vinayak Mahajan
W. L. Oo
S. Cimino
S. V. Khokale
K. Nagahiro
Luigi Pantisano
T. Ethirajan
J. Lemon
M. Gu
Y. Chen
H. T. Wang
T.H. Lee
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Citations (3)
Self-heating effects on Hot carrier degradation and its impact on logic circuit reliability
2019
IEEE Transactions on Device and Materials Reliability
P. Paliwoda
Zakariae Chbili
Andreas Kerber
T. Nigam
K. Nagahiro
S. Cimino
Maria Toledano-Luque
Luigi Pantisano
B. Min
Durgamadhab Misra
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Citations (7)
Self-Heating Effects on Hot Carrier Degradation and its Impact on Ring-Oscillator Reliability
2018
IIRW | International Integrated Reliability Workshop
P. Paliwoda
Z. Chbili
Andreas Kerber
T. Nigam
Dhruv Singh
K. Nagahiro
Prashanth Paramahans Manik
S. Cimino
Durgamadhab Misra
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Citations (2)
1